Changes of Microstructure versus Film Thickness in CoCrPtTa/NiCr Media.
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چکیده
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Film thickness dependence of microwave surface resistance and microstructure in YBa2Cu3O7ÿd thin ®lms
Film thickness dependence of microwave surface resistance, morphology and microstructures of YBa2Cu3O7ÿd thin ®lms were studied by X-ray diraction (XRD), AFM and transmission electron microscopy (TEM). There was no direct correlation between the microwave surface resistance and ®lm thickness, although full width at half maximum of XRD rocking curve of (0 0 5) peak increased with increase in ®l...
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ژورنال
عنوان ژورنال: Journal of the Magnetics Society of Japan
سال: 2001
ISSN: 0285-0192
DOI: 10.3379/jmsjmag.25.623